Please use this identifier to cite or link to this item: https://idr.l1.nitk.ac.in/jspui/handle/123456789/10836
Full metadata record
DC FieldValueLanguage
dc.contributor.authorBhat, K.N.
dc.contributor.authorPrabhu, K.N.
dc.contributor.authorSatyanarayan
dc.date.accessioned2020-03-31T08:23:10Z-
dc.date.available2020-03-31T08:23:10Z-
dc.date.issued2014
dc.identifier.citationJournal of Materials Science: Materials in Electronics, 2014, Vol.25, 2, pp.864-872en_US
dc.identifier.urihttp://idr.nitk.ac.in/jspui/handle/123456789/10836-
dc.description.abstractThe effect of reflow temperature and substrate surface roughness on wettability, intermetallics and shear strength of Sn-3.8Ag-0.7Cu solder alloy on copper (Cu) substrate was studied. It was found that increase in reflow temperature and substrate surface roughness improved the wettability of solder alloy. The size of needle shaped Cu6Sn5 IMCs (intermetallic compounds) increased with increase in temperature. The morphology of IMCs transformed from long to short needles with increase in substrate roughness. Shear strength and shear energy of the solder bond on rough Cu surfaces were found to be higher than that on smooth Cu surfaces. However, the sheared surfaces of the solder bond on rough Cu surface exhibited a transition ridge characterised by sheared IMCs whereas solder bond on smooth Cu surfaces exhibited completely ductile failure. Although, rough surface exhibited higher shear strength and shear energy, smoother surface is preferable due to its predominant bond failure in the solder matrix. 2013 Springer Science+Business Media New York.en_US
dc.titleEffect of reflow temperature and substrate roughness on wettability, IMC growth and shear strength of SAC387/Cu bondsen_US
dc.typeArticleen_US
Appears in Collections:1. Journal Articles

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.