Please use this identifier to cite or link to this item: https://idr.l1.nitk.ac.in/jspui/handle/123456789/7670
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dc.contributor.authorRajashekar, G.
dc.contributor.authorBhat, M.S.
dc.date.accessioned2020-03-30T10:02:37Z-
dc.date.available2020-03-30T10:02:37Z-
dc.date.issued2008
dc.identifier.citation2008 International Conference on Electronic Design, ICED 2008, 2008, Vol., , pp.-en_US
dc.identifier.urihttp://idr.nitk.ac.in/jspui/handle/123456789/7670-
dc.description.abstractThis paper presents a Resolution Adaptive Flash A/D Converter design and its performance. To achieve high speed, the proposed A/D converter utilizes Threshold Inverter Quantization technique replacing conventional analog comparators with digital comparators. The replacement results in a faster digital conversion and a reduction of the analog nodes in the ADC. The proposed ADC is a true variable resolution ADC, operates at 3-bit, 4-bit, 5-bit and 6-bit precision depending on control inputs. The proposed ADC is designed with AMS 0.35?m CMOS technology and 3.3V power supply voltage and a prototype chip is fabricated. Simulation results and test results are presented. �2008 IEEE.en_US
dc.titleDesign of resolution adaptive TIQ flash ADC using AMS 0.35?m technologyen_US
dc.typeBook chapteren_US
Appears in Collections:2. Conference Papers

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