Please use this identifier to cite or link to this item: https://idr.l1.nitk.ac.in/jspui/handle/123456789/8465
Title: Estimation of interconnect metrics using state space approach
Authors: Soorya, Krishna, K.
Pramod, M.
Bhat, M.S.
Issue Date: 2010
Citation: 2010 5th International Conference on Industrial and Information Systems, ICIIS 2010, 2010, Vol., , pp.255-260
Abstract: In this paper, we propose models for single and coupled on-chip global interconnect lines by distributed RLGC parameters using state space approach. Models for single and coupled lines are validated by comparing with SPICE simulations. Interconnect performance metrics are obtained from the proposed models for 65 nm, 90 nm, 130 nm and 180 nm technology nodes based on PTM values. In case of coupled interconnect lines, the effect of mutual inductance and coupling capacitance is considered in addition to the distributed RLGC parameters. The proposed models are generic in nature and illustrated by applying our modeling approach to four coupled interconnect lines. �2010 IEEE.
URI: http://idr.nitk.ac.in/jspui/handle/123456789/8465
Appears in Collections:2. Conference Papers

Files in This Item:
File Description SizeFormat 
8465.pdf1.62 MBAdobe PDFThumbnail
View/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.